FYS5310 – Electron Microscopy, Electron Diffraction and Spectroscopy II
Course description
Schedule, syllabus and examination date
Course content
The course gives a theoretical and practical introduction to topics in modern transmission electron microscopy (TEM) for investigations of materials. Special emphasis is given to understanding the scattering processes fast electrons experience in a material, and how they form the basis for determination of electronic and crystal structure using techniques such as Electron Energy-Loss Spectroscopy (EELS), scanning-TEM (STEM), electron holography, and (quantitative) Convergent Beam Electron Diffraction (CBED).
The course is suitable for students who will use TEM as part of their master's or Ph.D. studies, researchers participating in projects where TEM plays a central role, and for those who need to understand results from advanced TEM studies.
Learning outcome
After completing the course, you are able to:
- explain modern methods in electron microscopy, electron diffraction, and spectroscopy.
- discuss the advantages and disadvantages of the different methods.
- describe the interaction between the inelastic and elastic scattering of electrons in materials.
- evaluate the?consequences of different spreading mechanisms for the interpretation of diffraction, spectroscopy, and imaging data from TEM.
Admission to the course
Students who are admitted to study programmes at UiO must each semester register which courses and exams they wish to sign up for?in Studentweb.
Students admitted at UiO must?apply for courses?in Studentweb. Students enrolled in other Master's Degree Programmes can, on application, be admitted to the course if this is cleared by their own study programme.
Nordic citizens and applicants residing in the Nordic countries may?apply to take this course as a single course student.
If you are not already enrolled as a student at UiO, please see our information about?admission requirements and procedures for international applicants.
Recommended previous knowledge
Overlapping courses
- 10 credits overlap with FYS9320 – Electron Microscopy, Electron Diffraction and Spectroscopy II.
- 10 credits overlap with FYS5320 – Electron Microscopy, Electron Diffraction and Spectroscopy II.
Teaching
The course will be taught intensively with 2 hours of?lectures and 4 hours of colloquia/lab per week.
As?the?teaching involves laboratory and/or fieldwork, you should consider taking out separate travel and personal risk insurance.?Read about your insurance cover as a student.
Examination
- Final oral exam which counts 100 % towards the final grade.
It will also be counted as one of the three attempts to sit the exam for this course, if you sit the exam for one of the following courses: FYS9320 – Electron Microscopy, Electron Diffraction and Spectroscopy II
Grading scale
Grades are awarded on a scale from A to F, where A is the best grade and F is a fail. Read more about the grading system.
Resit an examination
Students who can document a valid reason for absence from the regular examination are offered a?postponed exam?at the beginning of the next semester.
New examinations?are offered at the beginning of the next semester for students who do not successfully complete the exam during the previous semester.
We do not offer a re-scheduled exam for students who withdraw during the exam.
More about examinations at UiO
- Use of sources and citations
- Special exam arrangements due to individual needs
- Withdrawal from an exam
- Illness at exams / postponed exams
- Explanation of grades and appeals
- Resitting an exam
- Cheating/attempted cheating
You will find further guides and resources at the web page on examinations at UiO.