David Brandon and Wayne D. Kaplan: Microstructural Characterization of Materials, Wiley & sons.
I tillegg til metodene beskrevet i l?reboken, vil n?ytron diffraksjon (ND) og skanningprobemikroskopi (SPM) inng? som pensum.
The material in chapter 7, 4.2.3 and 4.2.4, that is not included in the lecture notes, is not a part of the curriculum.
All material included in the lecture notes are part of the curriculum!