FYS9320 – Electron Microscopy, Electron Diffraction and Spectroscopy II
Course description
Schedule, syllabus and examination date
Course content
The course gives a theoretical and practical introduction to topics in modern transmission electron microscopy (TEM) for investigations of materials. Special emphasis is given to understanding the scattering processes fast electrons experience in a material, and how they form the basis for determination of electronic and crystal structure using techniques such as Electron Energy-Loss Spectroscopy (EELS), scanning-TEM (STEM), electron holography, and (quantitative) Convergent Beam Electron Diffraction (CBED).
The course is suitable for students who will use TEM as part of their master's or Ph.D. studies, researchers participating in projects where TEM plays a central role, and for those who need to understand results from advanced TEM studies.
Learning outcome
After completing the course, you are able to:
- explain modern methods in electron microscopy, electron diffraction, and spectroscopy.
- discuss the advantages and disadvantages of the different methods.
- describe the interaction between the inelastic and elastic scattering of electrons in materials.
- evaluate the?consequences of different spreading mechanisms?for the interpretation of diffraction, spectroscopy, and imaging data from TEM.
Admission to the course
PhD candidates from the University of Oslo should apply for classes and register for examinations through?Studentweb.
If a course has limited intake capacity, priority will be given to PhD candidates who follow an individual education plan where this particular course is included. Some national researchers’ schools may have specific rules for ranking applicants for courses with limited intake capacity.
PhD candidates who have been admitted to another higher education institution must?apply for a position as a visiting student?within a given deadline.
Recommended previous knowledge
Overlapping courses
- 10 credits overlap with FYS5310 – Electron Microscopy, Electron Diffraction and Spectroscopy II (continued).
- 10 credits overlap with FYS5320 – Electron Microscopy, Electron Diffraction and Spectroscopy II.
Teaching
The course will be taught intensively with 2 hours of?lectures and 4 hours of colloquia/lab per week.
Hand out of scientific articles that must be read and presented to the rest of the students. 3 to 5 chosen articles will be mandatory to read, one of which must be presented to the class.
Presenting an article to the class is mandatory before you can sit for the final oral exam.
As?the?teaching involves laboratory and/or fieldwork, you should consider taking out separate travel and personal risk insurance.?Read about your insurance cover as a student.
Examination
- Final oral exam which counts 100 % of the final grade.
This course has mandatory exercises that must be approved before you can sit the final?exam
It will also be counted as one of the three attempts to sit the exam for this course, if you sit the exam for one of the following courses: FYS5310 – Electron Microscopy, Electron Diffraction and Spectroscopy II (continued) and FYS5320 – Electron Microscopy, Electron Diffraction and Spectroscopy II
Grading scale
Grades are awarded on a pass/fail scale. Read more about?the grading system.
Resit an examination
Students who can document a valid reason for absence from the regular examination are offered a?postponed exam?at the beginning of the next semester.
New examinations?are offered at the beginning of the next semester for students who do not successfully complete the exam during the previous semester.
We do not offer a re-scheduled exam for students who withdraw during the exam.
More about examinations at UiO
- Use of sources and citations
- Special exam arrangements due to individual needs
- Withdrawal from an exam
- Illness at exams / postponed exams
- Explanation of grades and appeals
- Resitting an exam
- Cheating/attempted cheating
You will find further guides and resources at the web page on examinations at UiO.